| Paper Categories and Topics | First Author | DOI |
| Technique Basics – XPS, LEIS, Terminology | ||
| Importance of standard terminology in surface chemical analysis: ISO 18115-1:2023, general terms and terms used in spectroscopy. | Shard, AG | 10.1002/sia.7284 |
| XPS Insight Note: Coster–Kronig Broadening | Isaacs, M | 10.1002/sia.7410 |
| XPS Insight Note: Multiplet Splitting in X-Ray Photoelectron Spectra. | Isaacs, M | 10.1002/sia.7383 |
| Much Ado About Nothing? Background Anomalies Without Accompanying Primary Peaks in XPS and LEIS. | Pinder, J | 10.1002/sia.7378 |
| Instrument Related – set up, operation, damage, X-ray source, charge control | ||
| Surface science insight note: Optimizing XPS instrument performance for quantification of spectra. | Fernandez, V | 10.1002/sia.7296 |
| Detector Linearity and Deadtime Correction for Modern Photoelectron Spectrometers—Surface Analysis Insight Note. | Reed, B | 10.1002/sia.7411 |
| Insight Note. Complications of Magnesium Achromatic X-Rays in XPS: A Historical and Practical Perspective. | Jafari, S | 10.1002/sia.7377 |
| XPS insights: Sample degradation in X-ray photoelectron spectroscopy. | Morgan, DJ | 10.1002/sia.7205 |
| Leadley SR. HAXPES binding energy scale linearity check. | Leadly, SR | 10.1002/sia.7156 |
| Surface science insight note: Charge compensation and charge correction in XPS. | Mendoza-Sánchez, B | 10.1002/sia.7309 |
| XPS Analysis, Quantification, Depth Information | ||
| Surface Analysis Insight Note: Uncertainties in XPS Elemental Quantification. | Shard, AG | 10.1002/sia.7398 |
| Surface analysis insight note: Differentiation methods applicable to noisy data for determination of sp2- versus sp3-hybridization of carbon allotropes and AES signal strengths. | Fairley, N | 10.1002/sia.7157 |
| Surface analysis insight note: Straightforward concentration depth profiling by angle-resolved X-ray photoelectron spectroscopy using a Tikhonov regularization algorithm. | Murdoch, BJ | 10.1002/sia.7240 |
| Enhancing Oxygen Spectra Interpretation by Calculating Oxygen Linked to Adventitious Carbon. | Henderson, J | 10.1002/sia.7376 |
| XPS Imaging | ||
| Surface science insight note: Imaging X-ray photoelectron spectroscopy. | Fernandez, V. | 10.1002/sia.7337 |
| Surface analysis insight note: Initial, statistical evaluation of X-ray photoelectron spectroscopy images. | Moeini, B. | 10.1002/sia.7218 |
| Surface analysis insight note: Multivariate curve resolution of an X-ray photoelectron spectroscopy image. | Moeini, B | 10.1002/sia.7260 |
| Surface analysis insight note: Analysis of X-ray photoelectron spectroscopy images with summary statistics. | Moeini, B | 10.1002/sia.7248 |
| Surface analysis insight note. Principal component analysis (PCA) of an X-ray photoelectron spectroscopy image. The importance of preprocessing. | Moeini, B | 10.1002/sia.7252 |
| Surface analysis insight note: An example of a cluster analysis of spectra from an X-ray photoelectron spectroscopy image. | Moeini, B | 10.1002/sia.7270 |
| XPS Peaks Shape and Fitting | ||
| Surface analysis insight note: Synthetic line shapes, integration regions and relative sensitivity factors. | Fernandez, V | 10.1002/sia.7155 |
| XPS insights: Asymmetric peak shapes in XPS. | Morgan, DJ | 10.1002/sia.7215 |
| Insight note: XPS peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer. | Lizarbe, AJ | 10.1002/sia.7238 |
| XPS Insight Note—Strategies for Obtaining Peak Shapes and Inferring Chemistry | Morgan, DJ | 10.1002/sia.70014 |
| XPS and SIMS of Specific Samples or Sample Types | ||
| Surface science insight note: A linear algebraic approach to elucidate native films on Fe3O4 surface. | Bargiela, P | 10.1002/sia.7290 |
| Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities. | Fairley, N | 10.1002/sia.7276 |
| Surface analysis insight note: Accounting for X-ray beam damage effects in positive electrode-electrolyte interphase investigations. | Fantin, R | 10.1002/sia.7294 |
| Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films. | Bargiela, P | 10.1002/sia.7283 |
| Surface analysis insight note: XPS analysis of battery electrodes—Challenges with nickel–manganese–cobalt and Li examples using an Al Kα x-ray source. | Strange, LE | 10.1002/sia.7237 |
| TOF-SIMS and XPS protocol for the analysis of organic multilayers. | Guyot, C | 10.1002/sia.7277 |
