| Paper Categories and Topics | First Author | DOI |
| Selecting an appropriate surface analysis method, optimizing GCIBs, and roles of AI and ML | ||
| Selecting the best surface analysis method for your materials/samples | Kye J. Robinson | 10.1116/6.0003576 |
| Challenges in porosity characterization of thin films: Cross-evaluation of different techniques | Mikhail R. Baklanov | 10.1116/6.0002793 |
| Materials characterization: Can artificial intelligence be used to address reproducibility challenges? | Miu Lun Lau | 10.1116/6.0002809 |
| Application of machine learning to spectrum and image data | Satoka Aoyagi | 10.1116/6.0002858 |
| Sputter rates, depth resolution, and ion yields: A practical guide to choosing the best GCIB | N. Sano | 10.1116/6.0002864 |
| SIMS – Quantification, Data Analysis and Interpretation | ||
| Novel principal component analysis tool based on python for analysis of complex spectra of TOF-SIMS | Yadong Zhou | 10.1116/6.0003355 |
| Best practices for performing quantitative TOF-SIMS analyses | Alan M. Spool | 10.1116/6.0003660 |
| SIMS Applications – Batteries, Nanoparticles, and Semiconductors | ||
| VAMAS TWA interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS | Francesca Bennet | 10.1116/6.0002814 |
| ToF-SIMS in battery research: Advantages, limitations, and best practices | Teo Lombardo | 10.1116/6.0002850 |
| OrbiSIMS depth profiling of semiconductor materials—Useful yield and depth resolution | Yundong Zhou | 10.1116/6.0003821 |
| Scanning Probe – STM Tips and Nanoindentation | ||
| In situ plasmonic tip preparation and validation techniques for scanning tunneling microscopy | Benjamen N. Taber | 10.1116/6.0002807 |
| Some considerations in nanoindentation measurement and analysis by atomic force microscopy | Irit Rosenhek-Goldian | 10.1116/6.0003136 |
| UPS Work Function Determination and Immersion Ellipsometry of Ultrathin Films. | ||
| Immersion ellipsometry for uncorrelated determination of ultrathin film thickness and index of refraction | Samira Jafari | 10.1116/6.0003511 |
| Work function measurement by ultraviolet photoelectron spectroscopy: A versailles interlaboratory study | Jeong Won Kim | 10.1116/6.0002852 |
| XPS Data Analysis Quality and Reporting Issues | ||
| Insufficient reporting of XPS instrumental and peak fitting parameters (metadata) in the literature | George H. Major | 10.1116/6.0002714 |
| Perspective on improving the quality of data analysis in the literature with a focus on XPS | George H. Major | 10.1116/6.0002437 |
| XPS Extracting Information – Approaches to Data Collection, Analysis, and Peak Fitting | ||
| The case for denoising/smoothing X-ray photoelectron spectroscopy data by Fourier analysis | Alvaro J. Lizarbe | 10.1116/6.0004167 |
| Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting | George H. Major | 10.1116/6.0001975 |
| Double Lorentzian lineshape for asymmetric peaks in photoelectron spectroscopy | Alberto Herrera-Gomez | 10.1116/6.0002602 |
| Chemical significance of x-ray photoelectron spectroscopy binding energy shifts: A Perspective | Paul S. Bagus | 10.1116/6.0003081 |
| Angle resolved xps assessment of the structure and composition of nanofilm using the multilayer model | Alberto Herrera-Gomez | 10.1116/6.0002981 |
| Practical guides for XPS: Use of argon ion beams for sputter depth profiling and cleaning | Alexander G. Shard | 10.1116/6.0003681 |
| Practical guide on chemometrics/informatics in XPS. I. Introduction to methods useful for large or complex datasets | Tahereh G. Avval | 10.1116/6.0002082 |
| Practical guide on chemometrics/informatics in XPS. II. Example applications of multiple methods to the degradation of cellulose and tartaric acid | Tahereh G. Avval | 10.1116/6.0001969 |
| Practical guide to understanding goodness-of-fit metrics used in chemical state modeling of x-ray photoelectron spectroscopy data by synthetic line shapes using nylon as an example | Neal Fairley | 10.1116/6.0002196 |
| More from XPS: Informative but underused approaches to XPS data collection & analysis | Donald R. Baer | 10.1116/6.0004543 |
| XPS – HAXPES and NAP-XPS | ||
| Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy | Kateryna Artyushkova | 10.1116/6.0003740 |
| Current Trends in NAP-XPS. Degree of Reporting of Instrument Parameters | Matthew R. Linford | (Still in final review) |
| XPS Application to Specific Types of Materials and Systems – Catalysts, Oxides, Insulators, Iron and Steels, Actinides, Radiation Sensitive Materials | ||
| Examination of the use of XPS O 1s to characterize oxygen vacancies in catalytic materials and beyond | Christopher D. Easton | 10.1116/6.0004686 |
| Assignment of atomic charges in metal oxides based on core-level XPS spectra: The case of Ti in SrTiO3(001) | Scott A. Chambers | 10.1116/6.0004210 |
| Following the propagation of erroneous XPS peak fitting through the literature. A genealogical approach | B. Maxwell Clark | 10.1116/6.0004093 |
| Reevaluation of XPS Pt 4f peak fitting: Ti 3s plasmon peak interference and Pt metallic peak asymmetry in Pt@TiO2 system | Min-Ju Choi | 10.1116/6.0003973 |
| Interpretation of complex X-ray photoelectron peak shapes. I. Case study of Fe 2p3/2 spectra | A. E. Hughes | 10.1116/6.0003804 |
| Interpretation of complex X-ray photoelectron peak shapes. II. Case study of Fe 2p3/2 fitting applied to austenitic stainless steels 316 and 304 | A. E. Hughes | 10.1116/6.0003842 |
| Review of actinide core-level photoemission | Alaina Thompson | 10.1116/6.0003534 |
| XPS guide for insulators: Electron flood gun operation and optimization, surface charging, controlled charging, differential charging, useful FWHMs, problems and solutions, and advice | B. Vincent Crist | 10.1116/6.0003439 |
| Photoemission spectroscopy on photoresist materials: A protocol for analysis of radiation-sensitive materials | Faegheh S. Sajjadian | 10.1116/6.0002808 |
