| Paper Categories and Topics | First Author | DOI | JVSTA Reference | |
| Experimental Information and Planning | ||||
| First steps in planning, conducting, and reporting XPS measurements* | Baer, Donald R | 10.1116/6.0000873 | 39(2021)021601 | |
| Introduction to X-Ray Photoelectron Spectroscopy (XPS) | Stevie, Frederick A. | 10.1116/6.0000412 | 38(2020)063204 | |
| Sample Handling, Preparation and Mounting for XPS | Stevie, Frederick A. | 10.1116/6.0000421 | 38(2020)063202 | |
| Standards and metrology as tools to address reproducibility XPS | Unger, Wolfgang E. S. | 10.1116/1.5131074 | 38(2020)021201 | |
| Common errors in XPS analysis and reporting | Major, George H. | 10.1116/6.0000685 | 38(2020)061204 | |
| Instrument Set Up and Data Collection | ||||
| A rapid procedure check XPS instrument performance | Wolstenholme, John | 10.1116/6.0000224 | 38(2020)043206 | |
| Intensity calibration for XPS instruments using low-density polyethylene | Reed, Benjaman | 10.1116/6.0000577 | 38(2020)063208 | |
| Extension of Intensity calibration to multiple instrument geometries. | Shard, Alexander G. | 10.1116/6.0000578 | 38(2020)063209 | |
| Introduction to lateral resolution and analysis area measurements in XPS | Unger, Wolfgang E. S. | 10.1116/6.0000398 | 38(2020)053206 | |
| XPS Guide: Charge neutralization and binding energy referencing for insulating samples | Baer, Donald R | 10.1116/6.0000057 | 38(2020)031204 | |
| Peak Identification, Peak Fitting and Quantitative Analysis | ||||
| A Tutorial on Interpreting X-ray Photoelectron Spectroscopy (XPS) Survey Spectra* | Shah, Dhruv | 10.1116/1.5043297 |
36(2018)062902 (JVSTB ) |
|
| Guides to Quantitative XPS | Shard, Alexander G. | 10.1116/1.5141395 | 38(2020)041201 | |
| Perspective on quantitation accuracy in XPS | Brundle, Christopher R. | 10.1116/1.5141897 | 38(2020)041001 | |
| Introductory guide to backgrounds in XPS spectra | Engelhard, Mark H. | 10.1116/6.0000359 | 38(2020)063203 | |
| Practical guide for curve fitting in X-ray photoelectron spectroscopy | Major, George H. | 10.1116/6.0000377 | 38(2020)061203 | |
| Uncertainties in photoemission peak fitting | Herrera-Gomez, Alberto | 10.1116/1.5143132 | 38(2020)033211 | |
| Interpreting the Carbon 1s Spectrum | Gengenbach, Thomas R. | 10.1116/6.0000682 | 39(2021)013204 | |
| Correcting Peak Overlaps in Quantitative Auger Electron Spectroscopy of Cr-Containing Oxides | Burrell, Michael C | 10.1116/1.5128901 | 38(2020)013201 | |
| Path Lengths and Depth Information | ||||
| A Practical Guide to Path Lengths in XPS | Powell, Cedric J. | 10.1116/1.5141079 | 38(2020)023209 | |
| Experimental determination of electron attenuation lengths | Chambers, Scott A. | 10.1116/6.0000291 | 38(2020)043409 | |
| Practical Guide to the Use of Backgrounds in Quantitative XPS | Tougaard, Sven | 10.1116/6.0000661 | 39(2021)011201 | |
| Data and Reporting | ||||
| Data curation, archiving and storage | Suzuki, Mineharu | 10.1116/1.5128408 | 38(2020)023204 | |
| Role of consistent terminology in XPS reproducibility | Baer, Donald R | 10.1116/6.0000016 | 38(2020)031203 | |
| Technological or Scientific Applications | 38(2020)033206 | |||
| Achieving reproducibility in semiconductor technology | Conard, Thierry | 10.1116/1.5140746 | 38(2020)020804 | |
| Consistency and Reproducibility in Atomic Layer Deposition | Sønsteby, Henrik H | 10.1116/1.5140603 | 38(2020)023207 | |
| Guides for XPS Analysis of Polymers | Easton, Christopher D. | 10.1116/1.5140587 | 38(2020)033204 | |
| Guides to XPS study of catalysts | Davies, Philip R. | 10.1116/1.5140747 | 38(2020)061201 | |
| Guide to XPS measurements of Epitaxial Films and Heterostructures | Chambers, Scott A. | 10.1116/6.0000465 | 38(2020)031201 | |
| Guide to XPS Measurements on Nanoparticles | Baer, Donald R. | 10.1116/1.5141419 | 38(2020)023209 | |
| * Paper published before the topical collection was initiated but incorporated into the collection | ||||
